F
F. Bouwman
Researcher at NXP Semiconductors
Publications - 1
Citations - 57
F. Bouwman is an academic researcher from NXP Semiconductors. The author has contributed to research in topics: Chip & Design for testing. The author has an hindex of 1, co-authored 1 publications receiving 57 citations.
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Proceedings ArticleDOI
Test and debug strategy of the PNX8525 Nexperia/sup TM/ digital video platform system chip
TL;DR: The test and debug features of the Nexperia/sup TM/ PNX8525 chip are presented and the impact of core-based testing is discussed, at both the core-level and the top-level, together with the design-for-debug implementation on this multiple clock domain chip.