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Frank S. C. Lee

Researcher at Hong Kong Baptist University

Publications -  15
Citations -  256

Frank S. C. Lee is an academic researcher from Hong Kong Baptist University. The author has contributed to research in topics: Inductively coupled plasma mass spectrometry & Time-of-flight mass spectrometry. The author has an hindex of 7, co-authored 15 publications receiving 247 citations.

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Pyrolysis coupled with atomic absorption spectrometry for the determination of mercury in Chinese medicinal materials

TL;DR: In this paper, a pyrolysis unit was coupled to an atomic absorption spectrometer for the determination of mercury in solid samples of Chinese medicinal materials (CMMs), this highly sensitive analytical technique provides a simple and rapid method for the screening of Hg in CMM samples including raw herbs, mineral drugs and their derived formulated products.
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Analysis and leaching characteristics of mercury and arsenic in Chinese medicinal material

TL;DR: In this article, the authors investigated the leaching properties of heavy metals (As, Hg) leachable from Chinese medicinal materials (CMM) under conditions simulating stomach and intestine digestion and absorption.
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Quantification of nitrated polynuclear aromatic hydrocarbons in atmospheric particulate matter

TL;DR: In this paper, a derivatization-GC/ECD analytical method has been developed, which involves first the reduction of nitrated polynuclear aromatic hydrocarbons (NPAHs) to their corresponding amino PAHs by NaBH4.
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Analysis of nitrated polynuclear aromatic hydrocarbons.

TL;DR: The sensitivity and reproducibility of GC/negative ion chemical ionization MS (NICIMS) for the measurement of NPAHs after derivatization has been evaluated and has sensitivity comparable to GC/ECD, but is less reproducible in quantification.
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Chemical rank estimation by multiresolution analysis for two-way data in the presence of background

TL;DR: In this article, multiresolution analysis (MA) based on orthogonal wavelet bases is introduced to remove the influence of complex backgrounds and furthermore to correctly determine the number of components in a system.