抗原变异可使得多种致病微生物易于逃避宿主免疫应答。表达在感染红细胞表面的恶性疟原虫红细胞表面蛋白1（PfPMP1）与感染红细胞、内皮细胞、树突状细胞以及胎盘的单个或多个受体作用，在黏附及免疫逃避中起关键的作用。每个单倍体基因组var基因家族编码约60种成员，通过启动转录不同的var基因变异体为抗原变异提供了分子基础。

疟原虫var基因转换速率变化导致抗原变异[英]／Paul H, Robert P, Christodoulou Z, et al//Proc Natl Acad Sci U S A

1. Introduction 2. Theoretical foundations 3. Propagation and focusing of optical fields 4. Spatial resolution and position accuracy 5. Nanoscale optical microscopy 6. Near-field optical probes 7. Probe-sample distance control 8. Light emission and optical interaction in nanoscale environments 9. Quantum emitters 10. Dipole emission near planar interfaces 11. Photonic crystals and resonators 12. Surface plasmons 13. Forces in confined fields 14. Fluctuation-induced phenomena 15. Theoretical methods in nano-optics Appendices Index.

/pdf/principles-of-nano-optics-1hz998yqo8.pdf

Principles of nano-optics

http://experimentationlab.berkeley.edu/sites/default/files/AFMImages/butt_AFM.pdf

Force measurements with the atomic force microscope: Technique, interpretation and applications

Nitrogen doping has been an effective way to tailor the properties of graphene and render its potential use for various applications. Three common bonding configurations are normally obtained when doping nitrogen into the graphene: pyridinic N, pyrrolic N, and graphitic N. This paper reviews nitrogen-doped graphene, including various synthesis methods to introduce N doping and various characterization techniques for the examination of various N bonding configurations. Potential applications of N-graphene are also reviewed on the basis of experimental and theoretical studies.

https://s3-eu-west-1.amazonaws.com/pfigshare-u-files/1431849/NitrogenReviewonRecentProgressinNitrogenDopedGrapheneSynthesisCharacterizationandItsPotentialApplications.pdf

Review on Recent Progress in Nitrogen-Doped Graphene: Synthesis, Characterization, and Its Potential Applications

The widespread use of controlled molecular-level motion in key natural processes suggests that great rewards could come from bridging the gap between the present generation of synthetic molecular systems, which by and large rely upon electronic and chemical effects to carry out their functions, and the machines of the macroscopic world, which utilize the synchronized movements of smaller parts to perform specific tasks. This is a scientific area of great contemporary interest and extraordinary recent growth, yet the notion of molecular-level machines dates back to a time when the ideas surrounding the statistical nature of matter and the laws of thermodynamics were first being formulated. Here we outline the exciting successes in taming molecular-level movement thus far, the underlying principles that all experimental designs must follow, and the early progress made towards utilizing synthetic molecular structures to perform tasks using mechanical motion. We also highlight some of the issues and challenges that still need to be overcome.

Synthetic molecular motors and mechanical machines.

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force microscopy (FM-AFM). This technique, as well as other dynamic methods, is explained in detail in this article. In the last few years many groups have expanded the empirical knowledge and deepened our theoretical understanding of frequency-modulation atomic force microscopy. Consequently spatial resolution and ease of use have been increased dramatically. Vacuum atomic force microscopy opens up new classes of experiments, ranging from imaging of insulators with true atomic resolution to the measurement of forces between individual atoms.

https://hep.physics.utoronto.ca/WilliamTrischuk/courses/phy189/AFM_revmodphys.pdf

Advances in atomic force microscopy

Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7x7) surface was imaged in a noncontact mode by force microscopy with atomic resolution (6 angstroms lateral, 0.1 angstrom vertical).

/pdf/atomic-resolution-of-the-silicon-111-7x7-surface-by-atomic-4bwctw0otf.pdf

Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample interactions is related to the geometry of the tip apex. Published frequency versus distance data are used to show that the apex of tips providing atomic resolution is faceted and not rounded. Further, an extended jump-to-contact criterion for large amplitudes is established.

/pdf/forces-and-frequency-shifts-in-atomic-resolution-dynamic-3xjqnro58a.pdf

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Force sensors are key elements of atomic force microscopes and surface profilometers Sensors with an integrated deflection meter are particularly desirable Here, quartz tuning forks as used in watches are utilized as force sensors A novel technique is employed which simplifies the interpretation of the data and increases the imaging speed by at least one order of magnitude compared to previous implementations The variation of the imaging signal with distance fits well to a Hertzian contact model Images of compact discs and calibration gratings, which have been obtained with scanning speeds up to 230 μm/s, are presented

/pdf/high-speed-force-sensor-for-force-microscopy-and-2t72csa7ye.pdf

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.

/pdf/atomic-resolution-on-si-111-7-7-by-noncontact-atomic-force-3nhibrcn38.pdf

Franz J. Giessibl

Papers

Advances in atomic force microscopy

Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork