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G. Ehbauer

Researcher at VDO

Publications -  1
Citations -  14

G. Ehbauer is an academic researcher from VDO. The author has contributed to research in topics: Electronic circuit & Power electronics. The author has an hindex of 1, co-authored 1 publications receiving 14 citations.

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Reliability of High Temperature Inverters for HEV

TL;DR: In this paper, the crack propagation speed of bond and solder joint connections is calculated on the basis of the power electronics for a hybrid drive system, and the simulation results show that the reliability of these connections is improved with higher complexity.