G
G. Ehbauer
Researcher at VDO
Publications - 1
Citations - 14
G. Ehbauer is an academic researcher from VDO. The author has contributed to research in topics: Electronic circuit & Power electronics. The author has an hindex of 1, co-authored 1 publications receiving 14 citations.
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Reliability of High Temperature Inverters for HEV
TL;DR: In this paper, the crack propagation speed of bond and solder joint connections is calculated on the basis of the power electronics for a hybrid drive system, and the simulation results show that the reliability of these connections is improved with higher complexity.