G.J. Corbin

TL;DR: Annular dark-field imaging in an aberration-corrected scanning transmission electron microscope optimized for low voltage operation can resolve and identify the chemical type of every atom in monolayer hexagonal boron nitride that contains substitutional defects.

TL;DR: This work has designed and built an entirely new scanning transmission electron microscope (STEM), which includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors.

TL;DR: An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope is described, which will allow it to attain spectral energy stability comparable to systems usingmonochromators and spectrometers that are raised to near the high voltage of the instrument.

TL;DR: Advances in monochromator and spectrometer design have improved the energy resolution attainable in a scanning transmission electron microscope to 4.2 meV, and new applications of ultrahigh energy resolution EELS have not lagged behind.

TL;DR: A hybrid pixel direct detector is characterized and its suitability for electron energy loss spectroscopy (EELS) is demonstrated, including EELS of boron nitride in which an unsaturated zero loss peak is recorded at the same time as inner shell loss edges.