Matthew F. Chisholm

TL;DR: Annular dark-field imaging in an aberration-corrected scanning transmission electron microscope optimized for low voltage operation can resolve and identify the chemical type of every atom in monolayer hexagonal boron nitride that contains substitutional defects.

TL;DR: In this article, the mechanisms of deformation and damage evolution in electrodeposited, fully dense, nanocrystalline Ni with an average grain size of ~30 nm and a narrow grain size distribution were investigated by recourse to (i) tensile tests performed in situ in the transmission electron microscope and (ii) microscopic observations made at high resolution following ex situ deformation induced by compression, rolling and nanoindentation.

TL;DR: The data reveal that the specific interface structure and local asymmetries play an unexpected role in the polarization enhancement, and it is shown that even superlattices containing only single-unit-cell layers of BaTiO3 in a paraelectric matrix remain ferroelectric.

TL;DR: A review of recent results in developing improved control of growth, doping, and fabrication processes for ZnO devices with possible applications to ultraviolet (UV) light emitters, spin functional devices, gas sensors, transparent electronics, and surface acoustic wave devices is given in this article.

TL;DR: Direct images from an aberration-corrected scanning TEM are presented that resolve a lattice in which the atomic columns are sepa-rated by less than 0.1 nanometer.