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Giorgio Speranza

Researcher at fondazione bruno kessler

Publications -  199
Citations -  3538

Giorgio Speranza is an academic researcher from fondazione bruno kessler. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 28, co-authored 184 publications receiving 2762 citations. Previous affiliations of Giorgio Speranza include Kurchatov Institute & National University of Ireland, Galway.

Papers
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Proceedings ArticleDOI

High resolution QRS alignment and late potentials analysis

TL;DR: In this article, an optimal bandpass filter and high-resolution alignment techniques were used to extract a better fiducial synchronizing mark, and the effects of the main sources of error either in the time or frequency domain of LP analysis were investigated on a database of 16 electrocardiogram recordings.
Journal ArticleDOI

Tuning Surface Properties via Plasma Treatments for the Improved Capture of MicroRNA Biomarkers

TL;DR: Positively charged surfaces prepared via PE-CVD were demonstrated as being suitable materials for the capture of microRNA biomarkers, paving the way for their inclusion in biomedical devices for the purification and analysis of circulating biomarkers.
Proceedings ArticleDOI

Glass-Based Sub-Wavelength Photonic Structures

TL;DR: Attention will be focused on the structural and spectroscopic properties of glass-derived novel nano and micrometer scale range structures that, when activated by rare earth ions, represents the cornerstone in a wide number of technological applications such as integrated optical amplifiers, laser systems, and solar energy converters.
Proceedings ArticleDOI

Spectral analysis of the ventricular repolarisation duration in 24-hour Holter monitoring: technical requirements and early results

TL;DR: In this article, the authors examined the feasibility of measuring RT intervals in Holter ECG recordings in order to apply spectral analysis and proposed two algorithms for the detection of the maximum and the end of the T-wave.
Proceedings ArticleDOI

XPS Characterization of Materials for Photonic Applications

TL;DR: In this paper, the authors used X-ray photoelectron spectroscopy (XPS) to analyze the optical properties of planar waveguides and showed that the structural changes occurring in the waveguide surface composition led to the presence of a segregation of Sn below the surface of each of the layers.