G
Guan-chang Jin
Researcher at Tsinghua University
Publications - 10
Citations - 72
Guan-chang Jin is an academic researcher from Tsinghua University. The author has contributed to research in topics: Speckle pattern & Interferometry. The author has an hindex of 6, co-authored 10 publications receiving 69 citations.
Papers
More filters
Journal ArticleDOI
Applications of a novel phase-shift method using a computer-controlled polarization mechanism
TL;DR: In this paper, a phase-shifting apparatus based on polarization techniques is developed, which changes phase only by rotating a polarizer using a precise step motor and a specially designed decelerator.
Journal ArticleDOI
Automated Moire Contouring Of Diffuse Surfaces
Guan-chang Jin,Shouhong Tang +1 more
TL;DR: A simple new method of automatically reconstructing the 3-D surface of an object from 2-D moire patterns is proposed, which can automatically and accurately obtain phase value at every pixel point without assigning fringe orders and interpreting data in the regions between fringes by using a discrete cosine transform based algorithm.
Journal ArticleDOI
Electronic speckle pattern interferometer with polarization phase-shift technique
Guan-chang Jin,Shouhong Tang +1 more
TL;DR: In this article, an electronic speckle pattern interferometer with a polarization phase-shift technique for deformation measurement of a diffuse surface is proposed, where a common path optical phase shift arrangement is adopted in the interlerometer to improve the stability of the optical system.
Journal ArticleDOI
Surface detection and 3D profilometry for microstructure using optical metrology
Guan-chang Jin,Nai-Keng Bao +1 more
TL;DR: In this article, a surface detection or 3D profilometry for microstructure (millimeter size) based on the project grating method and phase measurement techniques is presented.
Journal ArticleDOI
Application of nondestructive testing methods to electronic industry using computer-aided optical metrology
TL;DR: Two key techniques, the cross-search algorithm and double-lens optical arrangement, were developed to provide the possibility of high processing speed and small object measurement and will make DSCM the most powerful NDT tool in electronic engineering.