H
H. Frank Howes
Researcher at Raytheon
Publications - 5
Citations - 171
H. Frank Howes is an academic researcher from Raytheon. The author has contributed to research in topics: Stuck-at fault & Automatic test pattern generation. The author has an hindex of 5, co-authored 5 publications receiving 171 citations.
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Patent
Byte addressable memory for variable length instructions and data
TL;DR: In this paper, variable length instruction and data words composed of multiple bytes are stored in a block of addressable locations in a memory so that individual bytes of each word are aligned in columns.
Patent
Apparatus and method for data error detection and correction and address error detection in a memory system
TL;DR: In this article, a modified Reed Solomon code is used to detect single symbol error correction and at least double symbol error detection of data and addressing errors using a modified version of the code.
Patent
LSI fault insertion
TL;DR: In this article, a fault parameter word is stored in a register and the outputs of the register are decoded to select the fault condition to be inserted by an interfacing circuit to the logic being tested.
Patent
Transient and intermittent fault insertion
TL;DR: Fault insertion circuits under programmable control and resident in an integrated circuit (LSI or VLSI) (10) insert transient and intermittent fault classes in addition to a permanent fault class into functional logic (24) on such integrated circuit as mentioned in this paper.