H
Habib Mustain
Researcher at Research Triangle Park
Publications - 1
Citations - 41
Habib Mustain is an academic researcher from Research Triangle Park. The author has contributed to research in topics: Power semiconductor device & Time-dependent gate oxide breakdown. The author has an hindex of 1, co-authored 1 publications receiving 30 citations.
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Proceedings ArticleDOI
SiC power device reliability
Donald A. Gajewski,Brett Hull,Daniel J. Lichtenwalner,Sei-Hyung Ryu,Eric Bonelli,Habib Mustain,Gangyao Wang,S.T. Allen,John W. Palmour +8 more
TL;DR: In this article, the wear-out mechanisms and intrinsic reliability performance of power SiC devices as characterized by time-dependent dielectric breakdown (TDDB), accelerated life test high temperature reverse bias (ALT-HTRB), terrestrial neutron exposure, and power cycling are discussed.