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Hiroki Minoda

Researcher at Tokyo University of Agriculture and Technology

Publications -  107
Citations -  1128

Hiroki Minoda is an academic researcher from Tokyo University of Agriculture and Technology. The author has contributed to research in topics: Vicinal & Reflection high-energy electron diffraction. The author has an hindex of 18, co-authored 105 publications receiving 1078 citations. Previous affiliations of Hiroki Minoda include Dr Emilio B Espinosa Sr Memorial State College of Agriculture and Technology & Tokyo Institute of Technology.

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Step bunching, step wandering and faceting: self-organization at Si surfaces

TL;DR: In this article, a review of step bunching, in-phase step wandering and faceting on smooth Si surfaces is presented in detail, and two cases on Si surfaces are described in detail: one is caused by unidirectional drift forces on adatoms on the surfaces, i.e., surface electromigration due to direct current specimen heating.
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Gold-induced faceting on a Si(001) vicinal surface: Spot-profile-analyzing LEED and reflection-electron-microscopy study

TL;DR: Au-induced faceting on Si(001) vicinal surface at temperatures between 750 and 880 was studied by in situ high-resolution low-energy electron diffraction and ultrahigh vacuum reflection electron microscopy as mentioned in this paper.
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Direct demonstration of the cross-bridge recovery stroke in muscle thick filaments in aqueous solution by using the hydration chamber.

TL;DR: Using the hydration chamber, with which biological specimens can be kept in an aqueous environment in an electron microscope, this work has succeeded in recording ATP-induced cross-bridge movement in hydrated thick filaments consisting of rabbit skeletal muscle myosin, with gold position markers attached to the cross-bridges.
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Phase-contrast scanning transmission electron microscopy.

TL;DR: The use of PPs can enhance the phase contrast of the STEM images of specimens in principle and the phase shift resulting from the PP, whose thickness corresponds to a phase shift of π, has been confirmed using interference fringes displayed in the Ronchigram of a silicon single crystal specimen.
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Direct-current-induced drift direction of silicon adatoms on Si(111)-(1×1) surfaces

TL;DR: In this article, the direction of the drift of adatoms induced by direct-current heating of Si(111)-(1×1) surfaces was studied from shape changes of a rectangular groove that was made by a focused ion beam (FIB) apparatus.