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Huihui Yu

Researcher at University of Science and Technology Beijing

Publications -  24
Citations -  453

Huihui Yu is an academic researcher from University of Science and Technology Beijing. The author has contributed to research in topics: van der Waals force & Semiconductor. The author has an hindex of 6, co-authored 17 publications receiving 103 citations.

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Near-ideal van der Waals rectifiers based on all-two-dimensional Schottky junctions.

TL;DR: In this article, a defect healing method is used to tune the height and width of the Schottky barrier at the interface between 2D metals and 2D semiconductors, leading to the realization of van der Waals rectifiers with enhanced performance.
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Piezotronic effect on interfacial charge modulation in mixed-dimensional Van der Waals heterostructure for ultrasensitive flexible photodetectors

TL;DR: In this paper, a novel strain-gating method was proposed to manipulate 2D WSe2-1D ZnO vdWs interfacial charge and modulate its photosensing performance.
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Hidden Vacancy Benefit in Monolayer 2D Semiconductors

TL;DR: In this paper, a hidden benefit of the atomic vacancies in monolayer 2D semiconductors to push their performance limit is reported, by purposely tailoring the sulfur vacancies (SVs) to an optimum density of 4.7%.