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Ib Alstrup

Researcher at Technical University of Denmark

Publications -  12
Citations -  984

Ib Alstrup is an academic researcher from Technical University of Denmark. The author has contributed to research in topics: Chemisorption & Atmospheric temperature range. The author has an hindex of 10, co-authored 12 publications receiving 952 citations.

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A combined X-Ray photoelectron and Mössbauer emission spectroscopy study of the state of cobalt in sulfided, supported, and unsupported CoMo catalysts

TL;DR: In this paper, the feasibility of using XPS to characterize the different Co-containing phases which may be present in sulfided Co-Mo catalysts was examined, and it was shown that by a combination of accurate determinations of binding energy differences and comparisons of peak shapes it is possible to distinguish the different CO phases in the catalysts by XPS.
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High temperature hydrogen sulfide chemisorption on nickel catalysts

TL;DR: The high temperature parts of the published sulfur chemisorption measurements are also well described by this expression as discussed by the authors, and it is suggested that the absence of a coverage dependence in the entropy term is due to subsurface chemistry.
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Innovation and science in the process industry: Steam reforming and hydrogenolysis

TL;DR: In this paper, the authors compared the performance of steam reforming, hydrogenolysis and carbon formation on nickel catalysts, modified by sulphur adsorption and copper alloying, and compared their experimental and theoretical results for NiAu surface alloys.
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Chemisorption of Methane on Ni(100) and Ni(111) Surfaces with Preadsorbed Potassium

TL;DR: In this paper, the authors performed large-scale density functional theory calculations of the dissociative chemisorption of methane on Ni(100) and Ni(111) surfaces with and without preadsorbed potassium.
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Xps study of chemisorption of CH4 on Ni(100)

TL;DR: In this paper, the sticking coefficient of CH 4 on Ni(100) has been determined as a function of coverage in the temperature range 400-550 K using XPS to monitor surface concentrations.