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J.A. Yagüe

Researcher at University of Zaragoza

Publications -  15
Citations -  325

J.A. Yagüe is an academic researcher from University of Zaragoza. The author has contributed to research in topics: Coordinate-measuring machine & System identification. The author has an hindex of 6, co-authored 15 publications receiving 303 citations.

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Kinematic parameter estimation technique for calibration and repeatability improvement of articulated arm coordinate measuring machines

TL;DR: In this paper, a new data capture technique for subsequent identification of an articulated arm coordinate measuring machines (AACMM) parameters, using nominal data reached by a ball bar gauge, along with the algorithm and objective functions used, based on a new approach including terms regarding measurement accuracy and repeatability.
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Calibration-based thermal error model for articulated arm coordinate measuring machines

TL;DR: In this paper, an empirical correction model for thermal errors is presented, which is based on the empirical arm positioning error characterization of several temperatures inside its measuring range and by posterior corrections implemented using an average error approximation.
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Self-centering probes with parallel kinematics to verify machine-tools

TL;DR: In this article, a self-centering probe is placed in the spindle of the machine-tool and a ball artifact on the work table, and the probe is moved to the calibrated center positions of the balls of the reference artifact.
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Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine

TL;DR: In this paper, a virtual measuring machine of this class was developed which incorporates a parametric model of a five-axis multi-sensor coordinate measuring machine, techniques to estimate the parametric errors in the model and error correction strategies for the same.
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Computer Tomography 3D Edge Detection Comparative for Metrology Applications

TL;DR: Different edge detection methods commonly used in areas like machine and computer vision are presented and analyzed as an alternative to the common methods used in CT for metrology applications to highlight its advantages and disadvantages from a metrological point of view.