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J.H. Neave

Researcher at Philips

Publications -  36
Citations -  3389

J.H. Neave is an academic researcher from Philips. The author has contributed to research in topics: Reflection high-energy electron diffraction & Molecular beam epitaxy. The author has an hindex of 23, co-authored 36 publications receiving 3358 citations.

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Dynamics of film growth of GaAs by MBE from Rheed observations

TL;DR: In this paper, the intensity oscillations in the specularly reflected and various diffracted beams in the RHEED pattern during MBE growth of GaAs, GaAs and Ge.
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Reflection high‐energy electron diffraction oscillations from vicinal surfaces—a new approach to surface diffusion measurements

TL;DR: In this article, a simple extension of the reflection high energy electron diffraction oscillation technique to vicinal surfaces provides a means of studying surface diffusion during molecular beam epitaxial growth, and some preliminary results for Ga diffusion during the growth of GaAs films with (001) 2×4 and 3×1 reconstructed surfaces are presented.
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Dynamic RHEED observations of the MBE growth of GaAs

TL;DR: In this article, the specular beam intensity in RHEED patterns from static and growing GaAs surfaces has been analyzed and the results have provided further understanding of growth dynamics and surface disorder, respectively.
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Rheed studies of heterojunction and quantum well formation during MBE growth-from multiple scattering to band offsets

TL;DR: In this article, the basic concepts and first-order growth model derived from the RHEED intensity oscillation technique are described and the limitations imposed by the experimentally demonstrated multiple-scattering nature of the diffraction process are indicated.
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Structure and stoichiometry of {100} GaAs surfaces during molecular beam epitaxy

TL;DR: In this paper, the relationship between surface structures on GaAs substrates and incident fluxes of Ga and As 4 has been examined in detail over the temperature range 300-950 K. The results are discussed in relation to surface kinetic information obtained from modulated beam measurements, and to some current theories of surface reconstruction and growth step behaviour.