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J. P. Enríquez

Researcher at National Autonomous University of Mexico

Publications -  8
Citations -  458

J. P. Enríquez is an academic researcher from National Autonomous University of Mexico. The author has contributed to research in topics: Thin film & Lattice constant. The author has an hindex of 6, co-authored 8 publications receiving 419 citations. Previous affiliations of J. P. Enríquez include Polytechnic University of Puerto Rico.

Papers
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Influence of the thickness on structural, optical and electrical properties of chemical bath deposited CdS thin films

TL;DR: In this paper, the XRD patterns show that the films are of hexagonal phase with preferred (0.0.2) orientation and the grain size increases with the thickness of the film.
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Structural modifications of SnO2 due to the incorporation of Fe into the lattice

TL;DR: In this paper, the effect of Fe doping on the structural properties of SnO2 has been investigated using X-ray diffraction and IR and Raman spectroscopic techniques and it was observed that the preferred orientation is along the (101) direction and both texture coefficient and preferential orientation show a dependence on doping level.
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XRD study of the grain growth in CdTe films annealed at different temperatures

TL;DR: In this paper, CdTe thin films electrodeposited on stainless steel substrates were annealed in air at various temperatures and time durations in order to investigate the influence of postdeposition heat treatments on the grain growth of the films.
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The effect of annealing on the structure of CdTe films electro-deposited on metallic substrates

TL;DR: In this paper, the influence of post-deposition heat treatments on the structure of CdTe films electrodeposited on stainless steel substrates was investigated using XRD.
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Structural characterization of CdTe thin films developed on metallic substrates by close spaced sublimation

TL;DR: In this paper, the influence of the temperatures of substrate and source on the various structural parameters such as lattice parameter, grain size and stress was reported and the investigations regarding the development of an interlayer between CdTe and the substrate are in progress and will be published in subsequent papers.