J
J.-R. Vaille
Researcher at Centre national de la recherche scientifique
Publications - 37
Citations - 576
J.-R. Vaille is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Operational amplifier & Optically stimulated luminescence. The author has an hindex of 14, co-authored 37 publications receiving 550 citations.
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Journal ArticleDOI
Physical Model for the Low-Dose-Rate Effect in Bipolar Devices
TL;DR: In this article, a physical model of the dose-rate effect in bipolar junction transistors is proposed, based on competition between trapping and recombination of radiation-induced carriers in the oxide.
Journal ArticleDOI
Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
Jerome Boch,Frédéric Saigné,Ronald D. Schrimpf,J.-R. Vaille,Laurent Dusseau,S. Ducret,M. Bernard,Eric Lorfevre,C. Chatry +8 more
TL;DR: In this paper, a time-saving method to predict the low-dose-rate degradation of bipolar linear microcircuits is proposed, which provides a good estimate of the degradation.
Journal ArticleDOI
Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit
M. Bernard,Laurent Dusseau,S.P. Buchner,Dale McMorrow,Robert Ecoffet,Jerome Boch,J.-R. Vaille,Ronald D. Schrimpf,Ken LaBel +8 more
TL;DR: In this paper, the authors investigated the effect of total ionizing dose (TID) on the single event transient (SET) sensitivity of a bipolar linear voltage comparator (LM139).
Journal ArticleDOI
An integrated sensor using optically stimulated luminescence for in-flight dosimetry
Laurent Dusseau,D. Plattard,J.-R. Vaille,G. Polge,G. Ranchoux,Frédéric Saigné,J. Fesquet,Robert Ecoffet,J. Gasiot +8 more
TL;DR: In this article, the feasibility of an integrated sensor based on Optically Stimulated Luminescence (OSL) dosimetry is demonstrated and a lab demonstrator is realized and a board designed to operate the sensor at different doses and doses rates.
Journal ArticleDOI
The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices
Jerome Boch,Y. Gonzalez Velo,Frédéric Saigné,Nicolas J.-H. Roche,Ronald D. Schrimpf,J.-R. Vaille,Laurent Dusseau,C. Chatry,Eric Lorfevre,Robert Ecoffet,Antoine Touboul +10 more
TL;DR: In this paper, a new approach based on dose-rate switching experiments has been proposed to characterize bipolar devices, and guidelines for its use are given, as an accelerated test technique for spacecraft reliability.