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J. Y. Robic

Publications -  3
Citations -  217

J. Y. Robic is an academic researcher. The author has contributed to research in topics: Thin film & Residual stress. The author has an hindex of 3, co-authored 3 publications receiving 211 citations.

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Residual stresses in evaporated silicon dioxide thin films: Correlation with deposition parameters and aging behavior

TL;DR: In this paper, the residual stresses in SiO2 thin films were determined by measurements of the radius of curvature of Si and Ge substrates, and the composition and density of films were deduced from Rutherford backscattering spectroscopy and elastic recoil detection analyses.
Journal ArticleDOI

Kinetics of residual stress evolution in evaporated silicon dioxide films exposed to room air

TL;DR: In this article, a reaction mechanism involving the physical adsorption of water vapor molecules on the SiO2 surface and reaction between adspecies and SiO-Si species is proposed and discussed to interpret the logarithmic kinetics of residual stress evolution in evaporated SiO 2 films exposed to room air.
Journal ArticleDOI

Residual stress in silicon dioxide thin films produced by ion-assisted deposition

TL;DR: In this paper, the residual stresses were determined in air and in vacuum by measurements of the radius of curvature of silicon substrates and the optical properties of the films were deduced from spectrophotometric measurements.