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Jean-François Robillard

Researcher at university of lille

Publications -  57
Citations -  1153

Jean-François Robillard is an academic researcher from university of lille. The author has contributed to research in topics: Silicon & Thermal conductivity. The author has an hindex of 16, co-authored 51 publications receiving 1021 citations. Previous affiliations of Jean-François Robillard include Centre national de la recherche scientifique & École centrale de Lille.

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Tunable magnetoelastic phononic crystals

TL;DR: In this article, the feasibility of tuning the band structure of phononic crystals is demonstrated by employing magnetostrictive materials and applying an external magnetic field, and the authors show the contactless tunability of the absolute band gaps of a two-dimensional phononic crystal composed of an epoxy matrix and Terfenol-D inclusions.

Tunable magnetoelastic phononic crystals

TL;DR: In this article, the feasibility of tuning the band structure of phononic crystals is demonstrated by employing magnetostrictive materials and applying an external magnetic field, and the authors show the contactless tunability of the absolute band gaps of a two-dimensional phononic crystal composed of an epoxy matrix and Terfenol-D inclusions.
Journal ArticleDOI

Band gap tunability of magneto-elastic phononic crystal

TL;DR: The possibility of control and tuning of the band structures of phononic crystals offered by the introduction of an active magnetoelastic material and the application of an external magnetic field is studied in this paper.
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Band structures tunability of bulk 2D phononic crystals made of magneto-elastic materials

TL;DR: In this article, the feasibility of contactless tunability of the band structure of two-dimensional phononic crystals was demonstrated by employing magnetostrictive materials and applying an external magnetic field.
Journal ArticleDOI

Complete thin film mechanical characterization using picosecond ultrasonics and nanostructured transducers: experimental demonstration on SiO2

TL;DR: In this article, the authors performed complete mechanical measurements in submicron films using the picosecond ultrasonic technique, where the Al layer deposited on the top of the sample acting as a transducer was replaced with a nanostructured Al film.