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Jeremy B. Muldavin

Researcher at Massachusetts Institute of Technology

Publications -  40
Citations -  2674

Jeremy B. Muldavin is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Insertion loss & Wafer. The author has an hindex of 17, co-authored 40 publications receiving 2620 citations. Previous affiliations of Jeremy B. Muldavin include University of Michigan.

Papers
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Journal ArticleDOI

RF MEMS switches and switch circuits

TL;DR: In this paper, the authors concentrate on electrostatic switches at 0.1-100 GHz with high reliability (100 million to 10 billion cycles) and wafer-scale manufacturing techniques.
Journal ArticleDOI

High-isolation CPW MEMS shunt switches. 1. Modeling

TL;DR: In this article, an electromagnetic model for membrane microelectromechanical systems (MEMS) shunt switches for microwave/millimeter-wave applications is presented, where the up-state capacitance can be accurately modeled using three-dimensional static solvers and full-wave solvers are used to predict the current distribution and inductance of the switch.
Journal ArticleDOI

High-isolation CPW MEMS shunt switches. 2. Design

TL;DR: In this article, the LC series resonance of the shunt switch was used to tune two and four-bridge "cross" switches from 10 to 40 GHz with an insertion loss of less than 0.3-0.6 dB, a return loss below -20 dB from 22 to 38 GHz in the up state, and a downstate isolation of 45-50 dB with only 1.5 pF of downstate capacitance.
Proceedings ArticleDOI

Nonlinear electro-mechanical modeling of MEMS switches

TL;DR: In this article, an accurate model of the switching mechanism of MEMS switches is presented based on a electro-mechanical analysis which takes into account the varying force and damping versus position (time).
Journal ArticleDOI

All-metal high-isolation series and series/shunt MEMS switches

TL;DR: In this article, an all-metal series switch with several different pull-down electrode geometries is presented, achieving an upstate capacitance of 5-9 fF and an isolation of -25 to -30 d8 at 10 GHz.