J
John Emyr MacDonald
Researcher at Cardiff University
Publications - 94
Citations - 2447
John Emyr MacDonald is an academic researcher from Cardiff University. The author has contributed to research in topics: Diffraction & Neutron scattering. The author has an hindex of 25, co-authored 94 publications receiving 2354 citations. Previous affiliations of John Emyr MacDonald include University of Wales & University of Bath.
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Journal ArticleDOI
Human Equilibrative Nucleoside Transporter 1 Levels Predict Response to Gemcitabine in Patients With Pancreatic Cancer
James J. Farrell,Hany Elsaleh,Miguel Garcia,Raymond Lai,Ali Ammar,William F. Regine,Ross A. Abrams,A. Bowen Benson,John Emyr MacDonald,Carol E. Cass,Adam P. Dicker,John R. Mackey +11 more
TL;DR: The gemcitabine transporter hENT1 is therefore a molecular and mechanistically relevant predictive marker of benefit from gem citabine in patients with resected pancreatic cancer.
Journal ArticleDOI
Surface X-ray scattering during crystal growth: Ge on Ge(111)
TL;DR: The growth of Ge on Ge(111) has been monitored by in situ x-ray reflectivity and diffraction, indicating growth by two-dimensional nucleation.
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X-ray diffraction study of the structure of thin polyfluorene films
S. Kawana,M. Durrell,J. Lu,John Emyr MacDonald,Martin Grell,Donal D. C. Bradley,P. C. Jukes,Richard A. L. Jones,S. L. Bennett +8 more
TL;DR: In this paper, the molecular arrangement in thin films of poly(9,9-dioctylfluorene) and poly( 9, 9-dihexylfluoresine) deposited on silicon substrates has been investigated with grazing incidence X-ray diffraction.
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X-ray diffraction from rough, relaxed and reconstructed surfaces
TL;DR: In this article, a general formalism is presented for computing the scattered X-ray intensity from surfaces showing disorder in the form of atomic-scale roughness or in the reconstructed domains of finite size.
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Quantitative electrostatic force microscopy-phase measurements
TL;DR: The phase mode of electrostatic force microscopy (EFM-phase) is a scanning probe microscopy technique used to measure electrostatic forces gradient as discussed by the authors, but unlike SKPM it does not yield a direct measurement of local potential.