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Jong Hoon Shin

Researcher at University of Michigan

Publications -  24
Citations -  980

Jong Hoon Shin is an academic researcher from University of Michigan. The author has contributed to research in topics: Semiconductor laser theory & Neuromorphic engineering. The author has an hindex of 12, co-authored 23 publications receiving 713 citations. Previous affiliations of Jong Hoon Shin include LG Electronics.

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Temporal data classification and forecasting using a memristor-based reservoir computing system

TL;DR: A reservoir computing hardware system based on dynamic tungsten oxide memristors that can efficiently process temporal data and can be used to perform time-series analysis, demonstrating isolated spoken-digit recognition with partial inputs and chaotic system forecasting.
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Electrical spin injection and threshold reduction in a semiconductor laser.

TL;DR: A spin-polarized vertical-cavity surface-emitting laser is demonstrated with electrical spin injection from an Fe/Al0.1Ga0.9As Schottky tunnel barrier and results in a maximum threshold current reduction and degree of circular polarization of 23% at 50 K.
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Experimental Demonstration of Feature Extraction and Dimensionality Reduction Using Memristor Networks

TL;DR: It is experimentally demonstrated that memristor arrays can be used to perform principal component analysis, one of the most commonly used feature extraction techniques, through online, unsupervised learning.
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K-means Data Clustering with Memristor Networks

TL;DR: Experimental implementation of memristor crossbar hardware systems that can allow direct comparison of the Euclidean distances without normalizing the weights, and enables unsupervised K-means clustering algorithm through online learning, and produces high classification accuracy for the standard IRIS data set.
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Metal induced inhomogeneous Schottky barrier height in AlGaN/GaN Schottky diode

TL;DR: In this paper, the dependence of barrier height inhomogeneity on the gate metal has been investigated for the AlGaN/GaN Schottky diode, and the analysis from the electroreflectance spectroscopy measurement for different types of gate metals tried (in this case, Au, Pt, Pd, and Ni) reveals that the surface donor states of AlGa N/Ga N heterostructure strongly depend on the type of Schotty gate metals used, which suggests that barrier height heterogeneity is strongly dependent on gate metal.