K
K. Schuster
Researcher at Max Planck Society
Publications - 5
Citations - 248
K. Schuster is an academic researcher from Max Planck Society. The author has contributed to research in topics: Semiconductor detector & Particle detector. The author has an hindex of 4, co-authored 5 publications receiving 246 citations.
Papers
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Journal ArticleDOI
Experimental confirmation of a new semiconductor detector principle
TL;DR: In this paper, a new detector-amplification principle proposed by Kemmer and Lutz in 1986 has been experimentally verified and used for detection of X-rays from a 241 am and from Am and from an 55 Fe source.
The MPI/AIT X ray Imager (MAXI): High speed PN-CCD's for x ray detection
L. Strueder,H. Braeuninger,M. Meier,Peter Predehl,Claus Reppin,M. Sterzik,J. Truemper,P. W. Cattaneo,D. Hauff,G. Lutz,K. Schuster,A. S. Schwarz,E. Kenziorra,A. Staubert +13 more
TL;DR: In this article, a fully depleted (sensitive) pn CCD of 280 μm thickness with a homogeneous sensitive area of 36 cm2 and a pixel size of 150×150 μm2 was proposed as focal plane instrumentation of the X-ray Multi Mirror Mission (XMM).
Journal ArticleDOI
The MPI/AIT X-ray imager (MAXI) — High speed pn CCDs for X-ray detection
Lothar Strüder,Heinrich Bräuninger,M. Meier,Peter Predehl,Claus Reppin,M. Sterzik,Joachim Trümper,P. W. Cattaneo,D. Hauff,G. Lutz,K. Schuster,A. S. Schwarz,E. Kenziorra,A. Staubert,E. Gatti,Antonio Francesco Longoni,Marco Sampietro,Veljko Radeka,Pavel Rehak,S. Rescia,P.F. Manfredi,W. Buttler,Peter Holl,J. Kemmer,U. Prechtel,T. Ziemann +25 more
TL;DR: In this article, a fully depleted (sensitive) pn CCD of 280 μm thickness with a homogeneous sensitive area of 36 cm2 and a pixel size of 150×150 μm2 was proposed as focal plane instrumentation of the X-ray Multi Mirror Mission (XMM).
Journal ArticleDOI
Design and performance of semiconductor detectors with integrated amplification and charge storage capability
P. Klein,Peter Lechner,G. Lutz,K. Schuster,Lothar Strüder,J. Kemmer,U. Prechtel,T. Ziemann,B. Heinemann,Ralf P. Richter +9 more
TL;DR: In this article, a detector-amplification principle based on the MOSFET on a depleted substrate has been demonstrated and tested, where the most important features of the structures are built-in amplification, charge storage capability and the possibility of nondestructive readout.
Proceedings ArticleDOI
Characterisation Of Fully Depleted Pn-CCD's For X-Ray Imaging
TL;DR: The second fabrication of fully depletable, backside illuminatable pn CCD's on high resistivity 280p,m thick silicon (σ = 2.5 kΩcm) has been tested as discussed by the authors.