K
Keith E. Holbert
Researcher at Arizona State University
Publications - 188
Citations - 2450
Keith E. Holbert is an academic researcher from Arizona State University. The author has contributed to research in topics: Irradiation & Absorbed dose. The author has an hindex of 24, co-authored 184 publications receiving 2256 citations. Previous affiliations of Keith E. Holbert include University Of Tennessee System & University of Tennessee.
Papers
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Journal ArticleDOI
Embedding remote experimentation in power engineering education
TL;DR: A new laboratory approach is described, as implemented in a virtual, Internet-based, experimentation platform, which utilizes real equipment distributed among multiple universities from which remotely located students can perform experiments.
Journal ArticleDOI
Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides
X.J. Chen,Hugh J. Barnaby,Bert Vermeire,Keith E. Holbert,D. Wright,R.L. Pease,G.W. Dunham,D.G. Platteter,J.E. Seiler,Steve McClure,Philippe C. Adell +10 more
TL;DR: In this article, a model that quantitatively establishes the relationship between excess molecular hydrogen (H2) and radiation-induced interface trap formation has been proposed, both experimentally and theoretically, showing increased radiation induced degradation with H2 concentration, and device degradation saturate at both high and low ends of H2 concentrations.
Book
Nuclear Energy: An Introduction to the Concepts, Systems, and Applications of Nuclear Processes
TL;DR: Nuclear Energy is one of the most popular texts on basic nuclear physics, systems, and applications of nuclear energy as mentioned in this paper, and it has been widely used in the engineering community.
Journal ArticleDOI
Enhanced TID Susceptibility in Sub-100 nm Bulk CMOS I/O Transistors and Circuits
Michael Lee McLain,Hugh J. Barnaby,Keith E. Holbert,Ronald D. Schrimpf,H. Shah,A. Amort,M. Baze,J. Wert +7 more
TL;DR: In this paper, a quantitative model is used to analyze the effects of doping and oxide trapped charge buildup along the sidewall of the shallow trench isolation oxide, which can be correlated to off-state leakage current.
Journal ArticleDOI
The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear Circuits
R.L. Pease,Philippe C. Adell,Bernard G. Rax,X.J. Chen,Hugh J. Barnaby,Keith E. Holbert,Harold P. Hjalmarson +6 more
TL;DR: In this paper, the authors show that the amount of hydrogen determines the total dose response versus dose rate, both the saturation at low dose rate and the transition dose rate between the high and low-dose rate responses.