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Kent M. Geib

Researcher at Sandia National Laboratories

Publications -  176
Citations -  4360

Kent M. Geib is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Vertical-cavity surface-emitting laser & Laser. The author has an hindex of 33, co-authored 175 publications receiving 4258 citations. Previous affiliations of Kent M. Geib include Colorado State University.

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Selectively oxidised vertical cavity surface emitting lasers with 50% power conversion efficiency

TL;DR: In this paper, an index-guided vertical cavity top-surface emitting laser diodes have been fabricated from an all epitaxial structure with conducting mirrors by selective lateral oxidation of AlGaAs.
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Low threshold voltage vertical-cavity lasers fabricated by selective oxidation

TL;DR: In this article, a vertical-cavity surface emitting laser fabricated using selective oxidation to form a current aperture under a top monolithic distributed Bragg reflector mirror is reported.
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Advances in selective wet oxidation of AlGaAs alloys

TL;DR: In this article, the chemistry, microstructure, and processing of buried oxides converted from AlGaAs layers using wet oxidation was reviewed and the influence of gas flow, gas composition, temperature, Al-content, and layer thickness on the oxidation rate was characterized.
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Room temperature continuous wave InGaAsN quantum well vertical cavity lasers emitting at 1.3 um

TL;DR: In this article, the authors used two n-type As/GaAs distributed Bragg reflectors with a selectively oxidized current aperture adjacent to the optical cavity, and the top output mirror contains a tunnel junction to inject holes into the active region.
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High-frequency modulation of oxide- confined vertical cavity surface emitting lasers

TL;DR: In this article, high-speed studies of oxide-confined, submilliampere threshold, oxide-constrained vertical cavity surface emitting lasers show modulation bandwidths > 16 GHz and very high modulation current efficiency factors occur at low bias but decrease as the modulation bandwidth and frequency of the relative intensity noise peak saturate at higher currents.