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Kiyoshi Takamasu

Researcher at University of Tokyo

Publications -  260
Citations -  2058

Kiyoshi Takamasu is an academic researcher from University of Tokyo. The author has contributed to research in topics: Interferometry & Metrology. The author has an hindex of 20, co-authored 258 publications receiving 1905 citations. Previous affiliations of Kiyoshi Takamasu include Shizuoka University & Tokyo Denki University.

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Intelligent Profile Measurement for Wide-Area Resist Surface Using Multi-Sensor AFM System

TL;DR: In this paper, an error separation approach used coupled distance sensors, together with an autocollimator as an additional angle measuring device, was consulted the potentiality for self-calibration of multi-cantilever.
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SCPNet-based correction of distorted multi-spots for three-dimensional surface measurement of metal cylindrical shaft parts.

TL;DR: Zhang et al. as discussed by the authors proposed a spot coordinate prediction network (SCPNet), which is a deep-learning neural network designed to predict spot coordinates, in combination with Hough circle detection for localization.

Super-hetrodyne interferometric length measurement using the repetition frequency of an optical frequency comb

TL;DR: In this paper, a high-accuracy length measurement method using an optical frequency comb is developed, which is traceable to the national frequency standards, where the repetition frequency is phase-locked to the frequency standards of an Rb frequency clock, and the laser diodes have offset frequencies of ∆ 1 and ∆ 2 to the mode of the optical comb, respectively.

Study on Improvement Methods of CMM (Coordinate Measuring Machine) in Workshop Environment

TL;DR: In this paper, the authors clarified the difference of thermal drift and conventional temperature correction in thermal errors of length and position measurement, and proposed a simple model of thermal drifting and correction method.
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In-process Measurement of Gradient Boundary of Resin in Evanescent-wave-based Nano-stereolithography using Reflection Interference Near Critical Angle

TL;DR: In this paper, an in-process measurement of gradient boundary using reflection interference technique to monitor the formation of cured resins and investigate the gradient boundary was proposed, where the variation of refractive index of resins in the curing process has been utilized in the measurement.