K
Kiyoshi Takamasu
Researcher at University of Tokyo
Publications - 260
Citations - 2058
Kiyoshi Takamasu is an academic researcher from University of Tokyo. The author has contributed to research in topics: Interferometry & Metrology. The author has an hindex of 20, co-authored 258 publications receiving 1905 citations. Previous affiliations of Kiyoshi Takamasu include Shizuoka University & Tokyo Denki University.
Papers
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Proceedings ArticleDOI
Multi-probe system comprising three laser interferometers and one autocollimator for measuring flat bar mirror profile with nanometer accuracy on a high-precision micro-coordinate measuring machine
Ping Yang,Tomohiko Takamura,Satoru Takahashi,Kiyoshi Takamasu,Osamu Sato,Sonko Osawa,Toshiyuki Takatsuji +6 more
TL;DR: In this paper, a multi-probe system consisting of three laser interferometers and one autocollimator was used to measure a flat bar mirror profile with nanometer accuracy.
Proceedings ArticleDOI
Absolute distance measurement of optical path length of non-contact three-dimensional nanoprofiler based on normal vector tracing method by tandem white-light interferometer
Jungmin Kang,Takao Kitayama,Ryo Kizaki,Yui Toyoshi,Kota Hashimoto,Agustinus Winarno,Kiyoshi Takamasu,Kazuya Yamamura,Katsuyoshi Endo +8 more
TL;DR: In this article, a non-contact three-dimensional nanoprofiler based on normal vector tracing method with the light straightness and absolute-calibrated goniometers as core concepts was developed.
Proceedings ArticleDOI
Absolute Distance Measurement Using Long-Path Heterodyne Interferometer with Optical Frequency Comb
TL;DR: In this article, a new heterodyne interference system with an acoustic-optical modulator and a piezo-electric transducer is presented to realize absolute long-distance measurement.
Journal ArticleDOI
Uncertainty Estimation in Intelligent Coordinate and Profile Measurement
TL;DR: In this article, an uncertainty propagation method was proposed to estimate the uncertainty of coordinate and profile measurement, and two examples of multi-sensor method with uncertainty estimation for profile measurement were introduced.