K
Kristen A. Peterson
Researcher at University of Connecticut
Publications - 6
Citations - 503
Kristen A. Peterson is an academic researcher from University of Connecticut. The author has contributed to research in topics: Interferometry & Optical coherence tomography. The author has an hindex of 3, co-authored 6 publications receiving 499 citations.
Papers
More filters
Journal ArticleDOI
Common-path interferometer for frequency-domain optical coherence tomography.
TL;DR: A Michelson-type spectral interferometer that uses a common beam path for the reference and the sample arms is described, which is well suited for frequency-domain optical coherence tomography of biological samples.
Journal ArticleDOI
Differential spectral interferometry: an imaging technique for biomedical applications.
TL;DR: Differential spectral interferometry efficiently removes the deleterious dc background inherent in SI measurements while maintaining the parallel nature of SI, and is competitive with OCT for biomedical applications in terms of image quality and acquisition rate.
Journal ArticleDOI
Resolving the complex conjugate ambiguity in Fourier-domain OCT by harmonic lock-in detection of the spectral interferogram
TL;DR: A method of resolving the complex conjugate ambiguity in Fourier-domain OCT by simultaneous acquisition of the first and second harmonics of the ac component of the phase-modulated interferogram.
Proceedings ArticleDOI
Resolving the Complex Conjugate Ambiguity in FD-OCT by Harmonic Lock-In Detection of the Spectral Interferogram
TL;DR: A new method of resolving the complex conjugate ambiguity in FD-OCT, where the quadrature components of the interferogram are obtained by simultaneous acquisition of the first and second harmonics of the phase-modulated interferograms, is presented.
Patent
Method for non-destructive evaluation of ceramic coatings
TL;DR: In this paper, a method for evaluating the condition of a ceramic coating deposited on a substrate comprising illuminating the ceramic coating with light, measuring the intensity of light returned from the coating as function of depth in the coating and transverse position on the coating, and analyzing the measured light intensities to obtain one or more of intensity of the exposed surface of the coating relative to the intensity returning from the substrate interface.