K
Kuan-Cheng Su
Researcher at United Microelectronics Corporation
Publications - 54
Citations - 183
Kuan-Cheng Su is an academic researcher from United Microelectronics Corporation. The author has contributed to research in topics: Electrostatic discharge & CMOS. The author has an hindex of 8, co-authored 54 publications receiving 171 citations.
Papers
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Patent
Fin diode structure
TL;DR: A fin diode structure and method of manufacturing the same is provided in this paper, which the structure includes a substrate, a doped well formed in the substrate and a plurality of fins of first conductivity type protruding from the well.
Proceedings ArticleDOI
ESD protection design with lateral DMOS transistor in 40-V BCD technology
TL;DR: In this paper, the authors proposed an ESD detection circuit for smart power applications with lateral double-diffused MOS (LDMOS) transistor, which can be quickly turned on to protect the output drivers during ESD stress.
Patent
ESD protection circuit and ESD protection device thereof
TL;DR: In this article, the ESD protection circuit is constructed between a first power rail and a second power rail, and includes a switching device, a low-pass filter, and a base of a BJT and a first resistor.
Proceedings ArticleDOI
Effect of multiple via layout on electromigration performance and current density distribution in copper interconnect
TL;DR: In this paper, the authors applied finite element analysis to find out the current density profiles and their variation between different multiple via structures and found that structures with more via gained better EM performance improvement.
Proceedings ArticleDOI
Latch-up free ESD protection design with SCR structure in advanced CMOS technology
TL;DR: In this paper, an electrostatic discharge (ESD) protection circuit with silicon-controlled-rectifier (SCR) device has been designed without latch-up risk, which can sustain 6.2kV human-body model (HBM) and 475V machine model (MM) ESD tests.