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L.S. Shuster

Researcher at Ufa State Aviation Technical University

Publications -  15
Citations -  714

L.S. Shuster is an academic researcher from Ufa State Aviation Technical University. The author has contributed to research in topics: Coating & Physical vapor deposition. The author has an hindex of 11, co-authored 14 publications receiving 624 citations.

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Effect of mechanical properties measured at room and elevated temperatures on the wear resistance of cutting tools with TiAlN and AlCrN coatings

TL;DR: In this article, a comprehensive study of the mechanical properties of TiAlN and AlCrN coated cutting tools has been performed at room and elevated temperatures (up to 500 °C) using Micro Material's NanoTest Platform System.
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Wear behavior of adaptive nano-multilayered AlTiN/MexN PVD coatings during machining of aerospace alloys

TL;DR: In this article, the nano-multilayered AlTiN/Me x N PVD coatings are applied to carbide tooling for cutting hard to machine alloys such as Ni-based Inconel 718 superalloy and Ti-based TiAl6V4 alloy.
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Structure, properties and wear performance of nano-multilayered TiAlCrSiYN/TiAlCrN coatings during machining of Ni-based aerospace superalloys

TL;DR: In this article, nano-multilayered TiAlCrSiYN/TiAlCrN coatings have been developed with various ratios of Ti/Al/Cr within Si+Y containing nano-layers for machining direct aged Inconel (DA) 718 and powder metallurgical ME 16 Ni-based superalloys.
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Wear behavior of adaptive nano-multilayered TiAlCrN/NbN coatings under dry high performance machining conditions

TL;DR: In this paper, the authors compared the tool life of different nano-multilayered TiAlCrN-based coatings with addition of transitional metals based (of V and VI groups) nitride layers.
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Multi-functional nano-multilayered AlTiN/Cu PVD coating for machining of Inconel 718 superalloy

TL;DR: In this article, the structure, properties, tribological and wear performance of the nano-multilayered AlTiN/Cu PVD coating have been investigated using High Resolution Transmission Electron Microscopy.