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Lanxia Cheng

Researcher at University of Texas at Dallas

Publications -  38
Citations -  1904

Lanxia Cheng is an academic researcher from University of Texas at Dallas. The author has contributed to research in topics: Atomic layer deposition & Thin film. The author has an hindex of 18, co-authored 38 publications receiving 1484 citations. Previous affiliations of Lanxia Cheng include University of Wisconsin–Milwaukee & Merck KGaA.

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Covalent Nitrogen Doping and Compressive Strain in MoS2 by Remote N2 Plasma Exposure.

TL;DR: It is found that the presence of nitrogen can induce compressive strain in the MoS2 structure, which represents the first evidence of strain induced by substitutional doping in a transition metal dichalcogenide material.
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Metal contacts on physical vapor deposited monolayer MoS2

TL;DR: It is shown that insertion of graphene can effectively decouple MoS2 from the perturbations imparted by metal contacts (e.g., strain), while maintaining an effective electronic coupling between metal contact and MoS1, suggesting that graphene can act as a conductive buffer layer in TMD electronics.
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HfSe2 Thin Films: 2D Transition Metal Dichalcogenides Grown by Molecular Beam Epitaxy

TL;DR: The growth of HfSe2 thin films using molecular beam epitaxy demonstrates the feasibility and significant potential of fabricating 2D material based heterostructures with tunable band alignments for a variety of nanoelectronics and optoelectronic applications.
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Remote Plasma Oxidation and Atomic Layer Etching of MoS2

TL;DR: This work shows that a remote O2 plasma can be useful for both surface functionalization and a controlled thinning method for MoS2 device fabrication processes.
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Nucleation and growth of WSe2: enabling large grain transition metal dichalcogenides

TL;DR: In this article, the fundamental nucleation and growth behavior of WSe2 was investigated through a detailed experimental design combined with on-lattice, diffusion-based first principles kinetic modeling to enable large area TMD growth.