A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

An imaging system for performing forward scanning imaging for application to therapeutic and diagnostic devises used in medical procedures. The imaging system includes forward directed optical coherence tomography (OCT), and non-retroreflected forward scanning OCT. Also interferometric imaging and ranging techniques and fluorescent, Raman, two-photon, and diffuse wave imaging can be used. The forward scanning mechanisms include a cam attached to a motor, pneumatic devices, a pivoting device, piezoelectric transducers, electrostatic driven slides for substantially transverse scanning; counter-rotating prisms, and offset lenses are used for arbitrary scanning. The imaging system of the invention is applied to hand held probes including probes integrated with surgical probes, scalpels, scissors, forceps and biopsy instruments. Hand held probes include forward scanning lasers. The imaging system is also applicable to laparoscopes and endoscopes for diagnostc and therapeutic intervention in body orifices, canals, tubes, ducts, vessels and cavities of the body. The imaging system includes application to surgical and high numerical aperture microscopes. An important application of the invention is implantation of the optical probe for periodic or continuous extraction of information from the tissue site where implanted.

Methods and apparatus for forward-directed optical scanning instruments

https://escholarship.org/content/qt8rf718jm/qt8rf718jm.pdf?t=krnesf

Recent Advances in Mechanical Micromachining

An imaging system for performing optical coherence tomography includes an optical radiation source; a reference optical reflector; a first optical path leading to the reference optical reflector; and a second optical path coupled to an endoscopic unit. The endoscopic unit preferably includes an elongated housing defining a bore; a rotatable single mode optical fiber having a proximal end and a distal end positioned within and extending the length of the bore of the elongated housing; and an optical system coupled to the distal end of the rotatable single mode optical fiber, positioned to transmit the optical radiation from the single mode optical fiber to the structure and to transmit reflected optical radiation from the structure to the single mode optical fiber. The system further includes a beam divider dividing the optical radiation from the optical radiation source along the first optical path to the reflector and along the second optical path; and a detector positioned to receive reflected optical radiation from the reflector transmitted along the first optical path and reflected optical radiation transmitted from the structure along the second optical path. The detector generates a signal in response to the reflected optical radiation from the reference reflector and the reflected optical radiation from the structure, and a processor generating an image of the structure in response to the signal from the detector. The system provides both rotational and longitudinal scanning of an image.

Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope

Introductory Fourier transform spectroscopy

We describe a system for fast three-dimensional profilometry, of both optically smooth and optically rough surfaces, based on scanning white-light techniques. The system utilizes an efficient algorithm to extract and save only the region of interference, substantially reducing both the acquisition and the analysis times. Rough and discontinuous surfaces can be profiled without the phase-ambiguity problems associated with conventional phase-shifting techniques. The system measures steps to 100 μm, scans a 10-μm range in 5 s, and has a smooth surface repeatability of 0.5 nm.

High-speed noncontact profiler based on scanning white-light interferometry

We describe a scanning white-light interferometer for high-precision surface structure analysis. Interferograms for each of the image points in the field of view of the instrument are generated simultaneously by scanning the object in a direction perpendicular to the object surface, while recording detector data in digital memory. These interferograms are then transformed into the spatial frequency domain and the surface height for each point is obtained by examination of the complex phase as a function of frequency. The final step is the creation of a complete three-dimensional image constructed from the height data and corresponding image plane coordinates. The measurement repeatability is better than 0·5 nm r.m.s. for a surface height range of 100 μm.

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

We demonstrate a simple way of increasing the data acquisition and processing speed in a scanning white-light interferometer for surface topography measurement. The method consists of undersampling interference data and processing the resultant sub-Nyquist interferograms in the frequency domain to create complete three-dimensional images. Experimental results on a 20-μm step height standard show a measurement repeatability of 10 nm.

Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms

The invention features methods and systems in which wavelength-tune PSI data is analyzed in the frequency domain to produce spectrally separated frequency peaks each corresponding to a particular pair of surfaces in an interferometric cavity defined by multiple pairs of surfaces. Each frequency peak provides optical path length information about a corresponding pair of surfaces in the cavity. As a result, the interferometric data from such cavities provides simultaneous information about multiple surfaces.

Frequency transform phase shifting interferometry

Phase-shifting interferometry is a preferred technique for high-precision surface form measurements, but the difficulty in handling the intensity distortions from multiple-surface interference has limited the general use of the technique to interferometer cavities producing strict two-beam interference. I show how the capabilities of phase-shifting interferometry can be extended to address this problem using wavelength tuning techniques. The basic theory behind the technique is reviewed and applied specifically to the measurement of parallel plates, where surfaces, optical and physical thickness, and homogeneity are simultaneously obtained. Basic system requirements are derived, common error sources are discussed, and the results of the measurements are compared with theory and alternative measurement methods.

Leslie L. Deck

Papers

High-speed noncontact profiler based on scanning white-light interferometry

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms

Frequency transform phase shifting interferometry

Fourier-transform phase-shifting interferometry