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M.A Reijme

Researcher at Eindhoven University of Technology

Publications -  11
Citations -  259

M.A Reijme is an academic researcher from Eindhoven University of Technology. The author has contributed to research in topics: Low-energy ion scattering & X-ray photoelectron spectroscopy. The author has an hindex of 7, co-authored 11 publications receiving 254 citations.

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Indium diffusion in model polymer light-emitting diodes

TL;DR: In this article, the diffusion of indium into polyphenylenevinylene (PPV) in model polymer light-emitting diodes (p-LEDs) was studied with Rutherford backscattering spectrometry (RBS), X-ray photoelectron spectroscopy (XPS), low energy ion scattering spectroscopic (LEIS) and particle induced Xray emission (PIXE).
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Surface segregation of silicon impurities in organic materials

TL;DR: In this article, low-energy ion scattering was used to determine the surface impurity fraction and to observe which groups at the surface are shielded by the segregated species in polydialkoxy phenylenevinylene (PPV), polycarbonate and dendrimer macromolecules.
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Domain structure, segregation and morphology of the Pt3Sn(111) surface

TL;DR: Using spot profile analysis low-energy electron diffraction, this article studied the domain structure and morphology of the Pt3Sn(111) surface after sputtering at room temperature and subsequent anneal treatments which result in the formation of the previously reported ( 3 × 3 ) R30° and (2×2) structures.
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Structure–activity relationships in the ammoxidation of ethylene in the absence of molecular oxygen over γ-Al2O3-supported molybdenum oxide catalysts

TL;DR: In this paper, the structure-activity relationship in the reaction of ethylene with ammonia to acetonitrile in the absence of gaseous oxygen over γ-Al 2 O 3 -supported molybdenum catalysts was investigated.
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Intermolecular segregation of siloxane in P3HT: surface quantification and molecular surface-structure

TL;DR: In this paper, the surface of spin-coated and solution-cast poly(3-hexylthiophene) (P3HT) films were analyzed by X-ray Photoelectron Spectroscopy and Low Energy Ion Scattering.