M
M. C. M. M. van der Wielen
Researcher at Radboud University Nijmegen
Publications - 7
Citations - 170
M. C. M. M. van der Wielen is an academic researcher from Radboud University Nijmegen. The author has contributed to research in topics: Scanning tunneling microscope & Electrochemical scanning tunneling microscope. The author has an hindex of 5, co-authored 7 publications receiving 168 citations.
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Direct observation of Friedel oscillations around incorporated SiGa dopants in GaAs by low-temperature scanning tunneling microscopy.
TL;DR: In this paper, the authors reported direct imaging of electrically active Si dopants near the GaAs(110) surface with a scanning tunneling microscope at a temperature of 4.2 K.
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Zn- and Cd-induced features at the GaAs(110) and InP(110) surfaces studied by low-temperature scanning tunneling microscopy
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STM-induced photon emission spectroscopy of granular gold surfaces in air
TL;DR: In this article, the effect of grain size and applied bias voltage on the spectrum of light emission has been studied under ambient conditions in the tip sample region of a scanning tunneling microscope (STM) consisting of an etched gold tip and a granular gold film.
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Progress toward spin‐sensitive scanning tunneling microscopy using optical orientation in GaAs
TL;DR: In this article, spin polarized electrons in GaAs are used for spin-sensitive scanning tunneling microscopy, and the results support the feasibility of using such tips as a spin sensitive local probe.
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Magneto-optical Faraday effect probed in a scanning tunneling microscope
Menno Willem Jose Prins,M. C. M. M. van der Wielen,DL Abraham,H. van Kempen,H.W. van Kesteren +4 more
TL;DR: In this paper, the authors used semiconductor tips as local photodetectors in a scanning tunneling microscope and demonstrated that this configuration is sensitive to small light intensity variations, as supported by a simple model.