M
M. E. O’Hern
Researcher at MTS Systems Corporation
Publications - 4
Citations - 298
M. E. O’Hern is an academic researcher from MTS Systems Corporation. The author has contributed to research in topics: Thin film & Pulsed laser deposition. The author has an hindex of 4, co-authored 4 publications receiving 281 citations.
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Journal ArticleDOI
Hardness and Young's modulus of amorphous a -SiC thin films determined by nanoindentation and bulge tests
M. A. El Khakani,Mohamed Chaker,A. Jean,S. Boily,Jean-Claude Kieffer,M. E. O’Hern,M.F. Ravet,F. Rousseaux +7 more
TL;DR: In this article, the properties of amorphous hydrogenated or hydrogen-free silicon carbide thin films were determined by using nanoindentation and bulge techniques, respectively, and it was shown that both hardness and Young's modulus are dependent on the film composition.
Journal ArticleDOI
Effect of laser intensity on the microstructural and mechanical properties of pulsed laser deposited diamond-like-carbon thin films
Malek Tabbal,P. Mérel,Mohamed Chaker,M. A. El Khakani,Erik G. Herbert,B. N. Lucas,M. E. O’Hern +6 more
TL;DR: In this article, a diamond-like carbon (DLC) thin film has been deposited at room temperature on Si substrates by ablation of a graphite target using a KrF excimer laser at intensities ranging from 0.9×108
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Linear dependence of both the hardness and the elastic modulus of pulsed laser deposited a-SiC films upon their Si–C bond density
TL;DR: In this article, a-SiC films exhibiting excellent hardness and elastic modulus mechanical properties, as determined by nanoindentation, have been deposited by means of the pulsed laser deposition (PLD) technique onto either Si(100) or fused quartz substrates, at deposition temperatures ranging from 20 to 650°C.
Journal ArticleDOI
Synthesis of diamond-like-carbon coatings by pulsed laser deposition: optimization of process parameters
Malek Tabbal,P. Mérel,Mohamed Chaker,M. A. El Khakani,Erik G. Herbert,B. N. Lucas,M. E. O’Hern +6 more
TL;DR: In this article, the microstructural and elastic properties of diamond-like carbon (DLC) thin films were investigated using XPS C 1s core-level signal, and the hardness and elastic modulus were measured by nanoindentation using the continuous stiffness measurement (CSM) technique.