M
M.J. Lee
Researcher at Imperial College London
Publications - 33
Citations - 316
M.J. Lee is an academic researcher from Imperial College London. The author has contributed to research in topics: Thin film & Ion implantation. The author has an hindex of 10, co-authored 33 publications receiving 306 citations.
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Journal ArticleDOI
Thin film transistors for displays on plastic substrates
TL;DR: In this paper, thin film transistors have been fabricated on polyethylene naphthalate using a low temperature CdSe process at a maximum temperature of 150°C, by evaporation and radio frequency sputtering onto unheated substrates.
Journal ArticleDOI
An investigation of doping of SnO2 by ion implantation and application of ion-implanted films as gas sensors
C.S. Rastomjee,R.S. Dale,R.J. Schaffer,F.H. Jones,Russell G. Egdell,G.C. Georgiadis,M.J. Lee,T.J. Tate,Lili Cao +8 more
TL;DR: In this article, thin films of SnO 2 were doped with 90 keV ions of Nb, Sb and Bi at a dose of 3 × 10 16 ions cm −2, and the implanted films were characterized by X-ray and ultraviolet photoemission spectroscopy, Auger depth profiling and sheet resistance measurements.
Journal ArticleDOI
n-Type doping of SnO2 thin films by Sb ion implantation
TL;DR: In this article, the effects of Sb implantation into textured thin films of SnO2 prepared by RF sputtering have been characterised by a range of techniques including secondary ion mass spectrometry (SIMS), X-ray and ultraviolet photoelectron spectroscopies (XPS and UPS), infrared reflectance, Xray diffraction and conductivity measurements.
Proceedings ArticleDOI
A novel correlated double sampling poly-Si circuit for readout systems in large area X-ray sensors
TL;DR: A novel poly-Si correlated double sampling circuit, which can be used as a noise and offset cancellation block in large area X-ray sensor readout electronics is presented and provides high speed and low power consumption.
Journal ArticleDOI
Flicker noise in gate overlapped polycrystalline silicon thin-film transistors
M. Rahal,M.J. Lee,A.P. Burdett +2 more
TL;DR: In this article, a study of the noise performance of gate overlapped polycrystalline silicon thin-film transistors (TFTs) is presented, where low-frequency noise measurements are carried out on n- and p-type samples fabricated by excimer laser crystallization.