M
M. J. Yoo
Researcher at Alcatel-Lucent
Publications - 4
Citations - 338
M. J. Yoo is an academic researcher from Alcatel-Lucent. The author has contributed to research in topics: Transistor & Electrometer. The author has an hindex of 3, co-authored 4 publications receiving 322 citations.
Papers
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Journal ArticleDOI
Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges
M. J. Yoo,T.A Fulton,H. F. Hess,R. L. Willett,L. N. Dunkleberger,R. J. Chichester,Loren Pfeiffer,K. W. West +7 more
TL;DR: The SETSE has been used to image and measure depleted regions, local capacitance, band bending, and contact potentials at submicrometer length scales on the surface of this semiconductor sample.
Proceedings ArticleDOI
Scanning Single Electron Transistor Microscopy: Imaging Individual Charges
M. J. Yoo,T.A Fulton,H. F. Hess,R. L. Willett,L. N. Dunkleberger,R. J. Chichester,Loren Pfeiffer,K. W. West +7 more
TL;DR: The single-electron transistor scanning electrometer (SETSEEM) as mentioned in this paper is a probe microscope capable of mapping static electric fields and charges with 100-nanometer spatial resolution and a charge sensitivity of a small fraction of an electron.
Journal ArticleDOI
Microscopy with a single electron transistor probe
TL;DR: In this paper, the coulomb blockade effect of a single electron transistor was harnessed to make an electrometer probe capable of imaging electric properties of a sample at 100 nm resolution.
Journal ArticleDOI
Scanning single-electron transistor microscopy: Imaging individual charges
M. J. Yoo,T.A Fulton,H. F. Hess,R. L. Willett,L. N. Dunkleberger,R. J. Chichester,Loren Pfeiffer,K. W. West +7 more
TL;DR: The single-electron transistor scanning electrometer (SETSEEM) as discussed by the authors is an active sensing element fabricated at the end of a sharp glass tip, capable of mapping static electric fields and charges with submicron (100nm) spatial resolution and fractional electron charge sensitivity.