M
M. Neumann
Researcher at University of Osnabrück
Publications - 5
Citations - 361
M. Neumann is an academic researcher from University of Osnabrück. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Thin film. The author has an hindex of 5, co-authored 5 publications receiving 310 citations.
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Journal ArticleDOI
XRD and XPS characterization of mixed valence Mn3O4 hausmannite thin films prepared by chemical spray pyrolysis technique
A. Moses Ezhil Raj,S. Grace Victoria,V. Bena Jothy,C. Ravidhas,Joachim Wollschläger,M. Suendorf,M. Neumann,M. Jayachandran,C. Sanjeeviraja +8 more
TL;DR: In this article, a spray pyrolysis technique has been employed successfully for the synthesis of single phase mixed valence spinel hausmannite thin films using alcoholic start solution of manganese acetate (Mn(CH3COO)2·4H2O) on pyrex glass substrates at atmospheric pressure using air as a carrier gas.
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Spray deposition and property analysis of anatase phase titania (TiO2) nanostructures
A. Moses Ezhil Raj,V. Agnes,V. Bena Jothy,C. Ravidhas,Joachim Wollschläger,M. Suendorf,M. Neumann,M. Jayachandran,C. Sanjeeviraja +8 more
TL;DR: Anatase phase titanium dioxide thin films have been deposited at various substrate temperatures by chemical spray pyrolysis of an aerosol of titanyl acetylacetonate in this paper.
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Studies on transparent spinel magnesium indium oxide thin films prepared by chemical spray pyrolysis
A. Moses Ezhil Raj,V. Senthilkumar,V. Swaminathan,Joachim Wollschläger,M. Suendorf,M. Neumann,M. Jayachandran,C. Sanjeeviraja +7 more
TL;DR: In this article, metal organic chemical spray pyrolysis technique was used to obtain a single-phase magnesium indium oxide (MgIn2O4) films with Mg/In ratio 0.50, and the observed optical band gaps varied from 3.18 to 3.86 eV.
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Combined depth profile analysis with SNMS, SIMS and XPS: Preferential sputtering and oxygen transport in binary metal oxide multilayer systems
TL;DR: In this paper, the authors performed depth profile measurements of binary metal oxide multilayer systems and developed a model of combined preferential sputtering and oxygen transport which accounts for the experimental results.
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XPS and SIMS/SNMS measurements on thin metal oxide layers
TL;DR: In this paper, the chemical state of the elements, which was monitored by XPS as a function of depth, plays the key role in the observed variations of SIMS signals in the interface region of the depth profiles.