M
M. Scott Bradley
Researcher at Massachusetts Institute of Technology
Publications - 13
Citations - 750
M. Scott Bradley is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Polariton & Thin film. The author has an hindex of 9, co-authored 13 publications receiving 697 citations. Previous affiliations of M. Scott Bradley include Colorado School of Mines.
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Strong coupling in a microcavity LED.
TL;DR: In this article, the authors demonstrate an electrically pumped exciton-polariton emission, the first device in which strongly coupled states of light and matter are electrically excited.
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Highly efficient resonant coupling of optical excitations in hybrid organic/inorganic semiconductor nanostructures
TL;DR: A novel hybrid organic/inorganic nanocomposite in which alternating monolayers of J-aggregates of cyanine dye and crystalline semiconductor quantum dots are grown by a layer-by-layer self-assembly technique that can reach efficiencies of up to 98% at room temperature is described.
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Critically coupled resonators in vertical geometry using a planar mirror and a 5 nm thick absorbing film
TL;DR: A (5.1+/-0.5) nm thick film of high oscillator strength J-aggregated dye critically couples to a single dielectric mirror, absorbing more than 97% of incident lambda = 591 nm wavelength light, corresponding to an effective absorption coefficient of (6.9+/- 0.7) x 10(6) cm(-1) for (film thickness)/lambda < 1%.
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Solid state cavity QED: Strong coupling in organic thin films
TL;DR: In this paper, the strong coupling limit of cavity quantum electrodynamics (QED) was reached at room temperature with large coupling strengths (Rabi-splitting >250 meV) in exciton-polariton microcavity structures.
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Photoluminescence quenching of tris-(8-hydroxyquinoline) aluminum thin films at interfaces with metal oxide films of different conductivities
TL;DR: In this article, a comprehensive study of photoluminescence quenching of tris-(8-hydroxyquinoline) aluminum at interfaces with thin films of tin oxide was performed using both steady-state and time-resolved measurements.