The use of VCO-based quantization within continuous-time (CT) SigmaDelta analog-to-digital converter (ADC) structures is explored, with a custom prototype in 0.13 mum CMOS showing measured performance of 86/72 dB SNR/SNDR with 10 MHz bandwidth while consuming 40 mW from a 1.2 V supply and occupying an active area of 640 mum times 660 mum. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which achieves first-order noise shaping of its quantization noise. The quantizer structure allows the second-order CT SigmaDelta ADC topology to achieve third-order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching of the DAC elements.

/pdf/a-12-bit-10-mhz-bandwidth-continuous-time-sigma-delta-adc-4lgzviw47n.pdf

A 12-Bit, 10-MHz Bandwidth, Continuous-Time $\Sigma\Delta$ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer

An 11-bit, 50-MS/s time-to-digital converter (TDC) using a multipath gated ring oscillator with 6 ps of effective delay per stage demonstrates 1st-order noise shaping. At frequencies below 1 MHz, the TDC error integrates to 80 fs (rms) for a dynamic range of 95 dB with no calibration required. The 157 times 258 mum TDC is realized in 0.13 mum CMOS and, depending on the time difference between input edges, consumes 2.2 to 21 mA from a 1.5 V supply.

/pdf/a-multi-path-gated-ring-oscillator-tdc-with-first-order-1tcs8ib8qx.pdf

A Multi-Path Gated Ring Oscillator TDC With First-Order Noise Shaping

A 3.6-GHz digital fractional-N frequency synthesizer achieving low noise and 500-kHz bandwidth is presented. This architecture uses a gated-ring-oscillator time-to-digital converter (TDC) with 6-ps raw resolution and first-order shaping of its quantization noise along with digital quantization noise cancellation to achieve integrated phase noise of less than 300 fs (1 kHz to 40 MHz). The synthesizer includes two 10-bit 50-MHz passive digital-to-analog converters for digital control of the oscillator and an asynchronous frequency divider that avoids divide-value delay variation at its output. Implemented in a 0.13-mum CMOS process, the prototype occupies 0.95-mm2 active area and dissipates 39 mW for the core parts with another 8 mW for the oscillator output buffer. Measured phase noise at 3.67 GHz carrier frequency is -108 and -150 dBc/Hz at 400 kHz and 20 MHz offset, respectively.

A Low-Noise Wide-BW 3.6-GHz Digital $\Delta\Sigma$ Fractional-N Frequency Synthesizer With a Noise-Shaping Time-to-Digital Converter and Quantization Noise Cancellation

A voltage-controlled oscillator (VCO) based analog-to-digital converter (ADC) is a time-based architecture with a first-order noise-shaping property, which can be implemented using a VCO and digital circuits. This paper analyzes the performance of VCO-based ADCs in the presence of nonidealities such as jitter, nonlinearity, mismatch, and the metastability of D flip-flops. Based on this analysis, design criteria for determining parameters for VCO-based ADCs are described. In addition, a digital calibration technique to enhance the spurious-free dynamic range degraded by the nonlinearity is also introduced. To verify the theoretical analysis, a prototype chip is implemented in a 0.13-?m CMOS process. With a 500-MHz sampling frequency, the prototype achieves a signal-to-noise ratio ranging from 71.8 to 21.3 dB for an input bandwidth of 100 kHz-247 MHz, while dissipating 12.6 mW and occupying an area of 0.078 mm2.

Analysis and Design of Voltage-Controlled Oscillator Based Analog-to-Digital Converter

We present an area-efficient neural signal-acquisition system that uses a digitally intensive architecture to reduce system area and enable operation from a 0.5 V supply. The architecture replaces ac coupling capacitors and analog filters with a dual mixed-signal servo loop, which allows simultaneous digitization of the action and local field potentials. A noise-efficient DAC topology and an compact, boxcar sampling ADC are used to cancel input offset and prevent noise folding while enabling “per-pixel” digitization, alleviating system-level complexity. Implemented in a 65 nm CMOS process, the prototype occupies 0.013 mm2 while consuming 5 μW and achieving 4.9 μVrms of input-referred noise in a 10 kHz bandwidth.

A 0.013 ${\hbox {mm}}^{2}$ , 5 $\mu\hbox{W}$ , DC-Coupled Neural Signal Acquisition IC With 0.5 V Supply

The use of VCO-based quantization within continuous-time (CT) ΣΔ analog-to-digital converter (ADC) structures is explored, with a custom prototype in 0.13 μm CMOS showing measured performance of 86/72 dB SNR/SNDR with 10 MHz bandwidth while consuming 40 mW from a 1.2 V supply and occupying an active area of 640 μm × 660 μm. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which achieves first-order noise shaping of its quantization noise. The quantizer structure allows the second-order CT SA ADC topology to achieve third-order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching of the DAC elements.

A 12-Bit, 10-MHz Bandwidth, Continuous-Time ΣΔ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer

This paper presents a mostly digital multiplying delay-locked loop (MDLL) architecture that leverages a new time-to-digital converter (TDC) and a correlated double-sampling technique to achieve subpicosecond jitter performance. The key benefit of the proposed structure is that it provides a highly digital technique to reduce deterministic jitter in the MDLL output with low sensitivity to mismatch and offset in the associated tuning circuits. The TDC structure, which is based on a gated ring oscillator (GRO), is expected to benefit other PLL/DLL applications as well due to the fact that it scrambles and first-order noise shapes its associated quantization noise. Measured results are presented of a custom MDLL prototype that multiplies a 50 MHz reference frequency to 1.6 GHz with 928 fs rms jitter performance. The prototype consists of two 0.13 mum integrated circuits, which have a combined active area of 0.06 mm2 and a combined core power of 5.1 mW, in addition to an FPGA board, a discrete DAC, and a simple RC filter.

/pdf/a-highly-digital-mdll-based-clock-multiplier-that-leverages-2ggv12ttge.pdf

A Highly Digital MDLL-Based Clock Multiplier That Leverages a Self-Scrambling Time-to-Digital Converter to Achieve Subpicosecond Jitter Performance

This paper presents a mostly digital multiplying delay-locked loop (MDLL) architecture that leverages a new time-to-digital converter (TDC) and a correlated double-sampling technique to achieve subpicosecond jitter performance. The key benefit of the proposed structure is that it provides a highly digital technique to reduce deterministic jitter in the MDLL output with low sensitivity to mismatch and offset in the associated tuning circuits. The TDC structure, which is based on a gated ring oscillator (GRO), is expected to benefit other PLL/DLL applications as well due to the fact that it scrambles and first-order noise shapes its associated quantization noise. Measured results are presented of a custom MDLL prototype that multiplies a 50 MHz reference frequency to 1.6 GHz with 928 fs rms jitter performance. The prototype consists of two 0.13 μm integrated circuits, which have a combined active area of 0.06 mm 2 and a combined core power of 5.1 mW, in addition to an FPGA board, a discrete DAC, and a simple RC filter.

M.Z. Straayer

Papers

A 12-Bit, 10-MHz Bandwidth, Continuous-Time $\Sigma\Delta$ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer

A Multi-Path Gated Ring Oscillator TDC With First-Order Noise Shaping

A 12-Bit, 10-MHz Bandwidth, Continuous-Time ΣΔ ADC With a 5-Bit, 950-MS/s VCO-Based Quantizer

A Highly Digital MDLL-Based Clock Multiplier That Leverages a Self-Scrambling Time-to-Digital Converter to Achieve Subpicosecond Jitter Performance

A Highly Digital MDLL-Based Clock Multiplier That Leverages a Self-Scrambling Time-to-Digital Converter to Achieve Subpicosecond Jitter Performance