M
Mahesh Angira
Researcher at National Institute of Technology, Hamirpur
Publications - 29
Citations - 208
Mahesh Angira is an academic researcher from National Institute of Technology, Hamirpur. The author has contributed to research in topics: Capacitive sensing & Insertion loss. The author has an hindex of 8, co-authored 22 publications receiving 145 citations. Previous affiliations of Mahesh Angira include Birla Institute of Technology and Science.
Papers
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Journal ArticleDOI
Design and investigation of a low insertion loss, broadband, enhanced self and hold down power RF-MEMS switch
Mahesh Angira,Kamaljit Rangra +1 more
TL;DR: In this article, a low insertion loss capacitive shunt RF-MEMS switch with float metal concept is proposed to reduce the capacitance in up-state of the device.
Journal ArticleDOI
Performance improvement of RF-MEMS capacitive switch via asymmetric structure design
Mahesh Angira,Kamaljit Rangra +1 more
TL;DR: In this paper, float metal concept has been utilized to make the asymmetric structure on either side of the transmission line to implement the switch, which is used to inductively tune the isolation in C, X and Ku bands.
Journal ArticleDOI
A novel design for low insertion loss, multi-band RF-MEMS switch with low pull-in voltage
Mahesh Angira,Kamaljit Rangra +1 more
TL;DR: In this paper, float metal concept is utilized to reduce the RF overlap area between the movable structure and central conductor of CPW for improving the insertion loss of the device, which has been achieved without affecting the downstate response.
Journal ArticleDOI
A novel capacitive RF-MEMS switch for multi-frequency operation
TL;DR: In this article, a novel capacitive RF-MEMS switch is realized through two non-uniform cantilevers with dissimilar shape to achieve the different value of inductance in the downstate of the device and hence the different electrical resonant frequency.
On the investigation of an interdigitated, high capacitance ratio shunt RF-MEMS switch for X- band applications
TL;DR: In this article, the authors presented a novel, highly compact capacitive shunt RF MEMS switch with high-k dielectric material in place of traditionally used SiO2.