scispace - formally typeset
M

Mahmood Uddin Mohammed

Researcher at University of Missouri–Kansas City

Publications -  15
Citations -  140

Mahmood Uddin Mohammed is an academic researcher from University of Missouri–Kansas City. The author has contributed to research in topics: Static random-access memory & Voltage. The author has an hindex of 4, co-authored 15 publications receiving 53 citations.

Papers
More filters
Journal ArticleDOI

High-Quality Optical Ring Resonator-Based Biosensor for Cancer Detection

TL;DR: In this paper, a new design of silicon photonics ring resonator based biosensor for the detection of the diseased cell is proposed for detecting different cancer cells, such as leukemia, cervical cancer, and breast cancer.
Proceedings ArticleDOI

Performance Stability Analysis of SRAM Cells Based on Different FinFET Devices in 7nm Technology

TL;DR: In this paper, the performance of different 6T SRAM designs implemented by different FinFET devices are compared for different pull-up, pull down and pass gate transistor (PU:PD:PG) ratios to identify the best 6T device for high speed and low power SRAM applications.
Journal ArticleDOI

FinFET based SRAMs in Sub-10nm domain

TL;DR: This review paper presents different types of SRAM bitcells and memory system architectures and presents a benchmarking between the Underlapped FinFET based SRAM and Design Technology Optimized FinFet Based SRAM to determine the robustness ofSRAM designs.
Journal ArticleDOI

Reliability and Energy Efficiency of the Tunneling Transistor-Based 6T SRAM Cell in Sub-10 nm Domain

TL;DR: The static noise margin, which is a critical measure of SRAM stability and reliability, is determined for hold, read and write operations of the 6T TFET SRAM cell and the robustness of the optimized TFET-based 6T SRAM circuit is evaluated at different supply voltages.
Proceedings ArticleDOI

A Low Leakage SRAM Bitcell Design Based on MOS-Type Graphene Nano-Ribbon FET

TL;DR: It is observed that the 10nm GNRFET based SRAMs have 16.43 times less standby leakage power compared to the 10 nm FinFET based 6T SRAM bitcell.