M
Makoto Takashima
Researcher at Toshiba
Publications - 8
Citations - 322
Makoto Takashima is an academic researcher from Toshiba. The author has contributed to research in topics: Fusion protein & Logic gate. The author has an hindex of 7, co-authored 7 publications receiving 319 citations.
Papers
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Patent
Pattern correction method, apparatus, and program
TL;DR: In this article, an environmental profile is determined based on whether or not another graphics pattern exists at the surroundings of each correction target cell included in the entered design layout data, and a target cell name is replaced with a prescribed cell name of correction pattern corresponding to the determined environmental profile by referencing a cell replacement table.
Patent
Automated wiring pattern layout method
TL;DR: In this article, an automated wiring pattern layout method is presented, where a first wiring pattern is generated with width W and extending in a first direction, and a second wiring pattern with width X and extending X in a direction perpendicular to the first pattern in a manner such that the end thereof ends at the end portion of the first one.
Proceedings ArticleDOI
An Integrated Mask Artwork Analysis System
TL;DR: A new LSI artwork analysis and processing system, called EMAP, is described with algorithms, a database schema and applications that provide the designer with the artwork verification and processing tools which include mask artwork processing, geometrical design rule checking, connectivity analysis and electrical circuit parameter calculation.
Proceedings ArticleDOI
Programs for Verifying Circuit Connectivity of MOS/LSI Mask Artwork
TL;DR: Three programs which perform connectivity rule check, logic gate recognition for logic simulation and circuit connectivity comparison are described, developed for verifying circuit connectivity extracted from mask artwork.
Proceedings ArticleDOI
A circuit comparison system with rule-based functional isomorphism checking
Makoto Takashima,Atsuhiko Ikeuchi,Shoichi Kojima,Toshikazu Tanaka,Tamaki Saitou,Jun-ichi Sakata +5 more
TL;DR: A circuit comparison system is described which compares two networks and points out inconsistencies, and three techniques are included: network reduction, graph isomorphicism-based comparison, and rule-based functional isomorphism checking for inconsistencies.