M
Maria F. Ebel
Researcher at Vienna University of Technology
Publications - 100
Citations - 1184
Maria F. Ebel is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Electron. The author has an hindex of 20, co-authored 100 publications receiving 1162 citations.
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Numerical description of photoelectric absorption coefficients for fundamental parameter programs
TL;DR: In this article, photoelectric absorption coefficients, coherent and incoherent scattering coefficients and mass attenuation coefficients in the energy range from 1 to 300 keV for elements from Z = 1 to 94 by a modified version of Scofield's tables in combination with scattering coefficients from Elam et al.
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Zur bestimmung der reduzierten dicke D/λ dünner Schichten mittels XPS
TL;DR: In this article, the Theorie der Methode des variablen Beobachtungswinkels zur rontgenphotoelektronenspektrometrischen Untersuchung dunner Schich is presented.
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Surface modification of polyethylene by photochemical introduction of sulfonic acid groups
TL;DR: A photochemical technique for the modification of polyethylene (PE) surfaces was developed in this article, where PE samples were irradiated with UV light in a gas atmosphere containing SO2 and air.
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Imaging XPS—A new technique, I—principles
TL;DR: In this paper, the dispersion properties of a spherical condenser-type spectrometer are exploited for decoding the energy and emission position of an analyzed photoelectron. But the only imaging XPS method to date which has been found to be practical is essentially a scanned-particle-beam method, like scanning AES, and it is only applicable to thin film specimens.
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Quantitative XPS — multiline approach
TL;DR: The algorithm for quantitative XPS analysis developed some years ago has been extended by a new presentation of the fundamental parameters and by using as many lines as possible from each element under investigation to reduce the influences of statistical and systematic errors on quantitative analysis results.