scispace - formally typeset
M

Marius Enachescu

Researcher at Politehnica University of Bucharest

Publications -  157
Citations -  1983

Marius Enachescu is an academic researcher from Politehnica University of Bucharest. The author has contributed to research in topics: Chemistry & Nanoparticle. The author has an hindex of 19, co-authored 133 publications receiving 1527 citations. Previous affiliations of Marius Enachescu include Lawrence Berkeley National Laboratory & Technische Universität München.

Papers
More filters
Journal ArticleDOI

A Molecular Pillar Approach To Grow Vertical Covalent Organic Framework Nanosheets on Graphene: Hybrid Materials for Energy Storage.

TL;DR: The v-COF-GO was converted into a conductive carbon material preserving the nanostructure of precursor with ultrathin porous carbon nanosheets grafted to graphene in edge-on orientation and was demonstrated as a high-performance electrode material for supercapacitors.
Journal ArticleDOI

Atomic Force Microscopy Study of an Ideally Hard Contact: The Diamond(111)/Tungsten Carbide Interface

TL;DR: In this paper, the authors demonstrate for the first time that the load dependence of the contact area in UHV for this extremely hard single asperity contact is described by the Derjaguin-M{umlt uller-Toporov continuum mechanics model.
Journal ArticleDOI

Observation of proportionality between friction and contact area at the nanometer scale

TL;DR: In this article, the nanotribological properties of a hydrogen-terminated diamond(111)/tungsten-carbide interface have been studied using ultra-high vacuum atomic force microscopy.
Journal ArticleDOI

Nanostructures: a platform for brain repair and augmentation.

TL;DR: The current approaches to create nanowires and nanocable structures are reviewed to critically evaluate their potential for developing unique nanostructure based sensors to improve recording and device performance to reduce noise and the detrimental effect of the interface on the tissue.
Journal ArticleDOI

Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111)

TL;DR: In this paper, the electrical current through the point-contact junction of an AFM tip is used to image the surfaces of bulk graphite and the surface of a graphitized carbon monolayer on Pt(111) under ultra-high-vacuum (UHV) conditions.