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Markku Kuittinen

Researcher at University of Eastern Finland

Publications -  237
Citations -  3634

Markku Kuittinen is an academic researcher from University of Eastern Finland. The author has contributed to research in topics: Grating & Diffraction grating. The author has an hindex of 32, co-authored 235 publications receiving 3327 citations. Previous affiliations of Markku Kuittinen include Tampere University of Technology & Nokia.

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Local Field Asymmetry Drives Second-Harmonic Generation in Noncentrosymmetric Nanodimers

TL;DR: It is demonstrated that second-harmonic generation (SHG) from arrays of non-centrosymmetric T-shaped gold nanodimers with a nanogap arises from asymmetry in the local fundamental field distribution and is not related strictly to Nanogap size.
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Metamaterials with Tailored Nonlinear Optical Response

TL;DR: It is demonstrated that the second-order nonlinear optical response of noncentrosymmetric metal nanoparticles (metamolecules) can be efficiently controlled by their mutual ordering in an array, opening new ways for tailoring the nonlinear responses of metamaterials and their tensorial properties.
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Enhancement of Second-Harmonic Generation from Metal Nanoparticles by Passive Elements

TL;DR: This work prepares arrays of gold nanoparticles that include both noncentrosymmetric particles with a second-order nonlinear optical response and passive particles with no second- order response, providing a completely new concept for optimizing the nonlinear responses of metamaterials.
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Second-harmonic generation from metal nanoparticles: resonance enhancement versus particle geometry.

TL;DR: It is demonstrated that optical second-harmonic generation from arrays of noncentrosymmetric gold nanoparticles depends essentially on particle geometry, and numerical simulations for both linear and second-order responses display unprecedented agreement with measurements.
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Refractive index and extinction coefficient dependence of thin Al and Ir films on deposition technique and thickness.

TL;DR: The optical properties of thin metallic films depend on the thickness of the film as well as on the deposition technique, and the refractive index and the extinction coefficient are defined using ellipsometry.