M
Michael Ante
Publications - 7
Citations - 194
Michael Ante is an academic researcher. The author has contributed to research in topics: Layer (electronics) & Coating. The author has an hindex of 3, co-authored 7 publications receiving 189 citations.
Papers
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Pulse enhanced electron emission (P3e™) arc evaporation and the synthesis of wear resistant Al–Cr–O coatings in corundum structure
TL;DR: P3e (TM) is a new approach in PVD technology for the deposition of metal oxides as mentioned in this paper, which is dedicated to the formation of alumina-based and other metallic oxide layers and comprises high current pulse technique for arc sources.
Patent
Layer system with at least one mixed crystal layer of a multi-oxide
TL;DR: In this article, a PVD layer system for the coating of workpieces encompasses at least one mixed-crystal layer of a multi-oxide having the following composition: (Me1 1-x Me2 x ) 2 O 3, where Me1 and Me2 each represent at least 1 of the elements Al, Cr, Fe, Li, Mg, Mn, Nb, Ti, Sb or V.
Patent
Layer system having at least one mixed crystal layer of a polyoxide
TL;DR: In this paper, a vacuum deposition method for the production of a mixed crystal layer of a polyoxide and accordingly coated tools and components are also disclosed, which is characterized by at least three lines associated with the corundum structure in a spectrum of the mixed crystal layers, measured by means of X-ray diffractometry.
Patent
Coating system having at least one double oxide mixed crystal coating
TL;DR: In this article, a PVD coating system for coating a workpiece contains at least one double oxide mixed crystal coating and the composition of the double oxide is (Me1Me2)O.
Patent
Laminated system with layer of mixed crystals of multicomponent oxide
TL;DR: In this paper, the crystal lattice of the mixed crystals layer has a structure of a corundum, which is characterised by at least three, preferably four, in particular, five lines attributed to the structure of corundium in the spectrum of a layer of mixed crystals, as measured by X-ray diffraction.