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Michael W. Vannier

Researcher at University of Chicago

Publications -  414
Citations -  20701

Michael W. Vannier is an academic researcher from University of Chicago. The author has contributed to research in topics: Iterative reconstruction & Tomography. The author has an hindex of 69, co-authored 391 publications receiving 19661 citations. Previous affiliations of Michael W. Vannier include University of Washington & Roy J. and Lucille A. Carver College of Medicine.

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Computer based upper extremity evaluation system

TL;DR: In this paper, an upper extremity evaluation system (20) includes a computer (24) and a directly connected three-dimensional position locator (32) which may be used by a therapist to enter data corresponding to the location of the flexed and extended joints of the hand, wrist and elbow.
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Lower extremity residual limb slippage within the prosthesis

TL;DR: Analysis of slippage within the prosthesis has been performed using a new experimental measurement method based on spiral x-ray computed tomography (SXCT) imaging that provides a feasible means for measuring residuum skin slipperage relative to the prostheses and skin deformation relative to tibia within an in situ prosthesis under load.
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Validity of multislice computerized tomography for diagnosis of maxillofacial fractures using an independent workstation.

TL;DR: CT imaging demonstrated high specificity and sensitivity for maxillofacial fractures and the association of axial/MPR/3D-CT images added important information in relationship to other CT protocols.
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Musculoskeletal applications of three-dimensional surface reconstructions.

TL;DR: Computer programs originally developed for craniofacial surgical planning and evaluation are applied to complex musculoskeletal problems and can produce high-quality surface reconstructions from CT scan slices without operator intervention.
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Helical CT image noise—analytical results

TL;DR: It is shown that helical CT image noise deviation is independent of transaxial position, proportional to the raw projection noise deviation, and not affected by the fan angle (approximately for the HE method).