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Mikhail Efremov

Researcher at University of Illinois at Urbana–Champaign

Publications -  10
Citations -  631

Mikhail Efremov is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Glass transition & Differential scanning calorimetry. The author has an hindex of 8, co-authored 10 publications receiving 597 citations. Previous affiliations of Mikhail Efremov include University of Wisconsin-Madison.

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Glass transition in ultrathin polymer films: calorimetric study.

TL;DR: The ultrasensitive differential scanning calorimetry is used to observe the glass transition in thin (1-400 nm) spin-cast films of polystyrene, poly (2-vinyl pyridine) and poly (methyl methacrylate) on a platinum surface and it is found that there is no appreciable dependence of theGlass transition temperature over the thickness range from hundreds of nanometers down to 3 nm thick films.
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Ultrasensitive, fast, thin-film differential scanning calorimeter

TL;DR: In this paper, the equipment for an ultrasensitive, fast, thin-film differential scanning calorimetry (TDSC) or nanocalorimetric technique is described.
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Probing Glass Transition of Ultrathin Polymer Films at a Time Scale of Seconds Using Fast Differential Scanning Calorimetry

TL;DR: In this article, the glass transition temperature of 3−400 nm thick spin-cast films of polystyrene, poly (2-vinyl pyridine), and poly (methyl methacrylate) on a platinum surface was measured.
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Glass transition of thin films of poly(2-vinyl pyridine) and poly(methyl methacrylate): nanocalorimetry measurements

TL;DR: In this article, glass transition properties of poly(2-vinyl pyridine (P2VP) and poly(methyl methacrylate) are discussed in terms of the standard Tool-Narayanaswamy-Moynihan (TNM) multi-parameter model.

SynthesisandCharacterizationofSingle-LayerSilver-Decanethiolate Lamellar Crystals

TL;DR: The synthesis of silver-decanethiolate (AgSC10) lamellar crystals with both layer-by-layer and in-plane ordering allows for a precise control of the number of layers.