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Ming L. Yu

Researcher at IBM

Publications -  15
Citations -  584

Ming L. Yu is an academic researcher from IBM. The author has contributed to research in topics: Ion & Scattering. The author has an hindex of 8, co-authored 15 publications receiving 579 citations.

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Direct Evidence of Electron Tunneling in the Ionization of Sputtered Atoms

TL;DR: In this article, strong neutralization of sputtered Cs/sup +/ ions is observed whenever the tunneling channel is opened by changing the surface work function so that a crossing of the Fermi level by the Cs 6s level occurs.
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Velocity Dependence of the Ionization Probability of Sputtered Atoms

TL;DR: In this paper, the velocity dependence of the ionization probability of sputtered oxygen layers from chemisorbed oxygen layers on V and Nb was studied and it was shown that ionization probabilities depend on the normal component of the emission velocity.
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Bond breaking and the ionization of sputtered atoms.

TL;DR: Analysis of static-mode ion-beam sputtering of Si/sup +/ from a Si (100) surface during oxidation and nitridation shows consistent with the ionization of sputtered atoms resulting from the breaking of the local chemical bond during sputtering.
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Real-time study of oxygen reaction on Si(100).

TL;DR: In this article, the reaction of oxygen on Si(100) surfaces from 700 to 950 µm in real-time with about 10 µm resolution was studied by using pulsed molecular-beam reactive scattering.
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Gas/surface reactions in the chemical vapor deposition of tungsten using WF6/SiH4 mixtures

TL;DR: In this article, the surface reactions of WF6/SiH4 mixtures on Si(100) were studied for chemical vapor deposition of tungsten using x-ray photoemission and molecular-beam reactive scattering.